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In this paper, an uncertain state filling method is proposed, which can not only effectively reduce the scan shifting power consumption, but also reduce the test time simultaneously for scan test. This method is based on the threshold algorithm of uncertain state filling, which can both reduce weighted transitions metric (WTM) and improve compression efficiency for test vectors. Experiments with ISCAS’89 benchmark circuits show that the proposed algorithm can make a good tradeoff between power consumption and compression efficiency.
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