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We report an implementation of a Kelvin bridge incorporating three SiC/EG quantized Hall resistance standards in an on-chip triple series connection. The bridge is functionalized at the i = 2 plateau index of the von Klitzing constant, RK = h/e2, and is used to calibrate a four-terminal resistance standard with a nominal value close to RK/2. This work demonstrates that a quantum Hall Kelvin bridge can reach a calibration standard uncertainty better than 10–8 using a commercial off-the-shelf voltmeter and current source and that its performance rivals present-day direct and cryogenic current comparators.
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