As a guest user you are not logged in or recognized by your IP address. You have
access to the Front Matter, Abstracts, Author Index, Subject Index and the full
text of Open Access publications.
Dimensional metrology —the measurement of dimensions, size, shape, form, texture, location— is a fundamental requirement for any manufacturing and trading economy. The SI unit of length, the metre, has recently been re-defined based on the speed of light, c. However the traceability route from c to practical measurements throughout all application fields is far from simple. This paper describes the traceability routes and solutions employed throughout the length scale, from nm to km, to deliver length metrology with traceability to the SI in a wide range of settings, from laboratory to factory.
This website uses cookies
We use cookies to provide you with the best possible experience. They also allow us to analyze user behavior in order to constantly improve the website for you. Info about the privacy policy of IOS Press.
This website uses cookies
We use cookies to provide you with the best possible experience. They also allow us to analyze user behavior in order to constantly improve the website for you. Info about the privacy policy of IOS Press.