Sonic Infrared Imaging (IR) technology is new to the NDT family; it is fast and wide area imaging method. It uses ultrasound as excitation source along with an infrared imaging system to observe the temperature change of the crack within the sample. This technology has shown the great capability to detect different types of defects in various materials. The ultrasound transducer generates a high energy ultrasonic pulse to be coupled to the test sample. The ultrasound transducer plays an important role in the SIR system; The occurrence of the nonlinear phenomenon and the resulting images are highly influenced by the choice of transducer size as well as the induced frequency. In this paper, we will present our study on the relationship between different transducer tip size with different single excitation frequency and energy consumption in the crack vicinity in Sonic Infrared Imaging.