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Linear Sampling Method for Localizing Small Anomalies in Microwave Imaging
Won-Kwang Park
57 - 64
10.3233/978-1-61499-836-5-57
Studies in Applied Electromagnetics and Mechanics
Volume 43: Electromagnetic Non-Destructive Evaluation (XXI)
Abstract

We design a linear sampling method to retrieve the shape of an anomaly in microwave imaging. It is is based on the structure of nonzero singular vectors associated with the nonzero singular values of a complex-symmetric matrix, whose elements are measured S-parameters. Simulation results shows the effectiveness and limitations of the linear sampling method in real-world microwave imaging.

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