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Magnetic Flux Leakage Testing for Defect Characterization
Weiying Cheng, Yoshinori Kamiyama, Keiji Tsukada
126 - 133
10.3233/978-1-61499-639-2-126
Studies in Applied Electromagnetics and Mechanics
Volume 41: Electromagnetic Nondestructive Evaluation (XIX)
Abstract

As a further study on the low-level magnetized magnetic flux leakage testing, numerical simulations and measurements were conducted to investigate the influence of liftoff variation, applicability of the approach to local thinning and material characterization. The results showed that by magnetizing a test object to a low strength level and acquiring the weak magnetic flux leakage signals by a highly sensitive magneto-impedance sensor, local thinning and the change of magnetic property can be detected.

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