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Probabilistic Two-Level Anomaly Detection for Correlated Systems
Bin Tong, Tetsuro Morimura, Einoshin Suzuki, Tsuyoshi Idé
1109 - 1110
10.3233/978-1-61499-419-0-1109
Frontiers in Artificial Intelligence and Applications
Volume 263: ECAI 2014
Abstract

We propose a novel probabilistic semi-supervised anomaly detection framework for multi-dimensional systems with high correlation among variables. Our method is able to identify both abnormal instances and abnormal variables of an instance.

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