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A Simple Time-Domain Method to Characterize a Conductor-Backed Low-Conductivity Material
Edward Rothwell, Raenita Fenner, Benjamin Crowgey
53 - 60
10.3233/978-1-60750-554-9-53
Studies in Applied Electromagnetics and Mechanics
Volume 33: Electromagnetic Nondestructive Evaluation (XIII)
Abstract

A simple method is presented to extract the dielectric constant and conductivity of a low-loss conductor-backed material layer using measured natural resonance frequencies. Because the material is assumed to have a small value of conductivity, a number of approximations can be invoked that simplify the computation of the theoretical natural frequencies and thus make the technique more robust. Experimental results are used to validate the approximations and demonstrate the usefulness of the technique.

$35.00 / €27.50 / £22.00
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