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Investigation of Self-Assembled Monolayers by Using a Scanning Probe Microscope
Harutyun Melikyan, Lkhamsuren Enkhtur, Tigran Sargsyan, Seungwan Kim, Arsen Babajanyan, Jonkchel Kim, Kiejin Lee
107 - 112
10.3233/978-1-60750-023-0-107
Studies in Applied Electromagnetics and Mechanics
Volume 32: Electromagnetic Nondestructive Evaluation (XII)
Abstract

A scanning probe microscope (SPM) technique has been used to investigate the material properties of self-assembled monolayers (SAMs) on gold. We demonstrate that SPM can achieve contactless detection of the thickness of SAMs. By measuring the reflection coefficient S11 at an operating frequency near 5.3 GHz, we could observe the thickness of SAMs. This nano-scale measurement of SAMs has a great potential for investigating the surface profile with high sensitivity.

$35.00 / €27.50 / £22.00
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