As a guest user you are not logged in or recognized by your IP address. You have
access to the Front Matter, Abstracts, Author Index, Subject Index and the full
text of Open Access publications.
This paper considers the inverse problem of estimating the depth profile of an unknown defect from measurements of transfer resistance. The results both finite-element analyses and experimental tests on specimens with notches of various shapes and sizes were used to develop a simple algorithm that allows a good reconstruction of the depth profile. A synthetic focusing technique is applied which improves the quality of the reconstruction.
This website uses cookies
We use cookies to provide you with the best possible experience. They also allow us to analyze user behavior in order to constantly improve the website for you. Info about the privacy policy of IOS Press.
This website uses cookies
We use cookies to provide you with the best possible experience. They also allow us to analyze user behavior in order to constantly improve the website for you. Info about the privacy policy of IOS Press.