The paper deals with non-destructive (NDT) microwave measurement of defects in metal samples exploiting the waveguide features at the defect depth evaluation. In this article some results concerning their evaluations regarding to microwave access are shown. More measurements were performed to evaluate the geometry of defects in metal samples. Apart from established methods two new unusual microwave connections are presented and the results with their use at defects examination are given and compared with the previous results. Their advantages are discussed and some proposals for their utilizations are given.