This paper presents a contribution in the framework of a novel method to extract defect location in conductive materials using data obtained from diffusive nondestructive evaluation (NDE) techniques such as eddy current testing. The method is based on the definition and extraction of the Time of Flight (TOF) for diffusive phenomena by using the Q-transform, a mapping that associates a wave propagation problem to a diffusion problem. In this work we present the method for extracting the TOF from diffusive data together with experimental and numerical tests for a simple configuration. The results clearly demonstrate the application of Q-Transform based approach in a realistic NDE setting.