Scanning near-field microwave microscopy is a versatile tool to image the surface of materials, with sub-wavelength spatial resolution, in terms of the impedance at microwave frequencies. The microscopic impedance spectroscopy gives the nature of the surface in terms of the dielectric and magnetic properties. The retrieval of the dielectric and magnetic properties depends on the stand-off distance between the near-field microwave source emanating from the electrically small monopole antenna and the surface of the sample. To maintain the stand-off distance, a novel phase based feedback control is proposed and implemented in a flexure scanning stage. This paper presents the enhancement of the images obtained using this feedback mechanism.
IOS Press, Inc.
6751 Tepper Drive
Clifton, VA 20124
Tel.: +1 703 830 6300
Fax: +1 703 830 2300 email@example.com
(Corporate matters and books only) IOS Press c/o Accucoms US, Inc.
For North America Sales and Customer Service
West Point Commons
Lansdale PA 19446
Tel.: +1 866 855 8967
Fax: +1 215 660 5042 firstname.lastname@example.org