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In this paper, real time flaw characterization inside the structure under test (SUT) exploiting Learning by Examples (LBE) strategies is illustrated in the framework of Electromagnetic NDT (E-NDT). In particular, several LBE methodologies are investigated when dealing with the inversion of Eddy Current Testing (ECT) data. The performance of LBE algorithms is evaluated in terms of CPU time efficiency, and prediction accuracy on noisy data. Towards this end, a comparison between different regression techniques is shown by considering both synthetic and real experimental ECT data.
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