In this paper we investigate a new approach for extracting features from a texture using Dijkstra's algorithm. The method maps images into graphs and gray level differences into transition costs. Texture is measured over the whole image comparing the costs found by Dijkstra's algorithm with the geometric distance of the pixels. In addition, we compare and combine our new strategy with a previous method for describing textures based on Dijkstra's algorithm. For each set of features, a support vector machine (SVM) is trained. The set of classifiers is then combined by weighted sum rule. Combining the proposed set of features with the well-known local binary patterns and local ternary patterns boosts performance. To assess the performance of our approach, we test it using six medical datasets representing different image classification problems. Tests demonstrate that our approach outperforms the performance of standard methods presented in the literature. All source code for the approaches tested in this paper will be available at: http://www.dei.unipd.it/node/2357.
IOS Press, Inc.
6751 Tepper Drive
Clifton, VA 20124
Tel.: +1 703 830 6300
Fax: +1 703 830 2300 email@example.com
(Corporate matters and books only) IOS Press c/o Accucoms US, Inc.
For North America Sales and Customer Service
West Point Commons
Lansdale PA 19446
Tel.: +1 866 855 8967
Fax: +1 215 660 5042 firstname.lastname@example.org