Pattern matching is one of the basic topics in computer science. There were two waves of tens research into pattern matching. Due to new problems and changes in the model as well as its practical application, we must now examine pattern matching problems in the context of new models. Such considerations give rise to many interesting research problems in this area. The main difference between the last two waves of pattern matching research and the new wave is the need to deal with more practical questions. Such problems are encountered in industry applications first, while in the past the researchers had suggested the problems themselves. Two papers [4, 16] could be already tagged as the beginning of the new wave. We discuss the new challenges that must be handled in these exciting future research directions.
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