Pulsed low-energy positron beams of variable energy are powerful tools for defect profiling in materials. In this lecture we will at first describe two pulsed-beam systems developed over the last two decades: The Pulsed Low Energy Positron System (PLEPS) for depth-resolved defect profiling and the Scanning Positron Microscope (SPM), which in addition offers lateral resolution. We then consider some examples of applications of those pulsed beams to condensed matter problems. Next, the limits of those systems are discussed. Finally, we will give an outlook how pulsing with many positrons may be achieved and used for the purposes of materials sciences by combining existing experimental equipment with a strong positron source.